Introduction
Aluminum Nitride (AlN) substrates are widely used in high-power electronic and optoelectronic applications due to their excellent thermal conductivity and electrical insulation properties. When ordering AlN substrates, specifying the correct resistance properties is crucial to ensure optimal performance in your application. This article outlines the key resistance properties to consider, presents relevant data, and provides solutions to common challenges in substrate selection.
Key Aluminum Nitride Resistance Properties
When ordering AlN substrates, the following resistance properties should be specified to meet application requirements:
Property | Description | Typical Range |
---|---|---|
Volume Resistivity | Measures the material's resistance to electric current flow through its volume | 1012 - 1014 Ω·cm |
Surface Resistivity | Indicates resistance to current flow along the surface | 1011 - 1013 Ω/sq |
Dielectric Strength | Maximum electric field the material can withstand without breakdown | 15-25 kV/mm |
Thermal Resistance | Opposition to heat flow through the substrate | 0.5-2.0 °C·cm2/W |
Comparative Data of AlN Resistance Properties
The following table compares AlN resistance properties with other common substrate materials:
Material | Volume Resistivity (Ω·cm) | Thermal Conductivity (W/mK) | Dielectric Strength (kV/mm) |
---|---|---|---|
Aluminum Nitride | 1012-1014 | 170-200 | 15-25 |
Alumina | 1014-1016 | 20-30 | 8-15 |
Beryllium Oxide | 1014-1016 | 250-300 | 10-15 |
Silicon Carbide | 102-106 | 120-200 | 20-30 |
Common Issues in AlN Substrate Selection
One frequent problem encountered when selecting aluminum nitride substrates is thermal management in high-power applications. While AlN has excellent thermal conductivity, improper specification of resistance properties can lead to:
Insufficient electrical insulation at high temperatures
Current leakage due to inadequate volume resistivity
Premature breakdown from unspecified dielectric strength requirements
Thermal runaway in power electronics applications
Solutions for Optimal AlN Substrate Performance
To address these challenges and ensure proper aluminum nitride substrate performance in harsh environments, consider the following solutions:
Issue | Solution | Specification Requirement |
---|---|---|
High temperature insulation | Select high-purity AlN with controlled oxygen content | Volume resistivity >1013 Ω·cm at 300°C |
Current leakage | Specify surface finish and cleaning process | Surface resistivity >1012 Ω/sq |
Dielectric breakdown | Request certified dielectric strength testing | Minimum 20 kV/mm breakdown voltage |
Thermal management | Optimize substrate thickness and metallization | Thermal resistance<1.0 °C·cm2/W |
For high reliability aluminum nitride substrates, it's recommended to work closely with your supplier to specify all relevant resistance properties based on your specific application requirements and operating conditions.